MAPAN-Journal of Metrology Society of India SCIE

中文简介

《印度计量学会》是一本季刊。它专门从事计量(科学、工业或法律)。它通过发表关于科学、工业和法律计量学的独家文章，满足了计量学家，特别是高质量从业者的重要需求。该杂志出版的研究通讯或技术文章，目前感兴趣的测量科学;计量相关领域的原创工作、教程或测量论文;计量学的回顾和分析研究;关于测量的可靠性、不确定性的案例研究;以及相互比较和能力测试的报告和结果。

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英文简介

MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology.The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.